Experimental circuit model generation of non-uniform coupled multi-conductor structures

被引：0
|
作者：
Sercu, S
Martens, L
机构：
来源：
1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES | 1997年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the paper a new method is described for the experimental circuit modeling of non-uniform coupled multi-conductor structures. The method can handle a large number of coupled conductors N since it reduces the modeling of the 2N-port to the modeling of a number easier to model 4-port structures. All electrical properties, such as reflection, transmission, backward and forward crosstalk between the conductors of the structure are included in the model. To illustrate the method, a 35-pins high density backplane connector is modeled.
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页码：1781 / 1784
页数：4
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