共 50 条
- [2] Transient analysis of semiconductor devices using an MeV ion microprobe. ION BEAM MODIFICATION OF MATERIALS, 1996, : 1114 - 1117
- [9] ION MICROPROBE TRACE-ELEMENT ANALYSIS WITH HIGH MASS RESOLUTION INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 22 (3-4): : 333 - 338