MOTT-SCHOTTKY ANALYSIS OF ELECTRODEPOSITED ZnS THIN FILMS

被引：0
|
作者：
Nicoara, Adrian [1 ]
机构：
[1] Univ Babes Bolyai, Fac Chim & Ingn Chim, RO-400084 Cluj Napoca, Romania
来源：
STUDIA UNIVERSITATIS BABES-BOLYAI CHEMIA | 2008年 / 53卷 / 01期
关键词：
ZnS; thin film; semiconductor; impedance spectroscopy;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Some semiconductor properties, flat band potential and donor density, of electrodeposited ZnS thin films were evaluated by Mott-Schottky analysis. To this aim the depletion region capacitance of semiconductor/solution interface was determined by analysis of impedance spectrums.
引用
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页码：23 / 30
页数：8
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