Intelligent process trend recognition fault diagnosis and industrial application

被引：0
|
作者：
Lu, Sien [1 ]
Huang, Biao [1 ]
机构：
[1] Univ Alberta, Dept Chem & Mat Engn, Edmonton, AB T6G 2G6, Canada
来源：
COMPUTATIONAL INTELLIGENCE, PT 2, PROCEEDINGS | 2006年 / 4114卷
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
An intelligent process monitoring approach, which consists of process trend recognition and fault detection, is presented in this paper. This method incorporates wavelet transform, symbolic representation of data trend, pattern recognition, and Hidden Markov model (HMM) for intelligent reasoning. A simulation example and an industrial case study have shown the value of this approach.
引用
收藏
页码：637 / 642
页数：6
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