Analysis of Fe-Si layered structures by reflected electron energy loss spectroscopy and inelastic scattering cross-section

被引：0
|
作者：
Parshin, A. S. [1 ]
Aleksandrova, G. A. [1 ]
Varnakov, S. N. [1 ,2 ]
Ovchinnikov, S. G. [2 ]
机构：
[1] MF Reshetnev Siberian State Aerosp Univ, Krasnoyarsk, Russia
[2] Russian Acad Sci, LV Kirenskii Inst Phys, Siberian Div, Krasnoyarsk, Russia
来源：
JOURNAL OF STRUCTURAL CHEMISTRY | 2009年 / 50卷 / 03期
基金：
俄罗斯基础研究基金会;
关键词：
reflected electron energy loss spectroscopy; inelastic scattering cross-section; mean length of the inelastic free path of an electron;
D O I：
10.1007/s10947-009-0064-5
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
This paper reports on our study of the formation of an interface of layered structures in the Fe-Si system by reflected electron energy loss spectroscopy (REELS). Quantitative element analysis was performed using the product of the mean length of the inelastic free path by the inelastic scattering cross-section of electrons. It is shown that the Fe-Si interface is quite uniform.
引用
收藏
页码：429 / 433
页数：5
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