Low complexity erasure insertion in RS-coded SFH spread-spectrum communications with partial-band interference and Nakagami-m fading

被引:22
|
作者
Yang, LL [1 ]
Hanzo, L [1 ]
机构
[1] Univ Southampton, Dept Elect & Comp Engn, Southampton SO17 1BJ, Hants, England
关键词
errors-and-erasures decoding; frequency-hopping; joint maximum output and ratio threshold test; M-ary frequency-shift keying; Nakagami fading; output threshold test; partial band interference; ratio threshold test; Reed-Solomon codes; spread-spectrum communications;
D O I
10.1109/TCOMM.2002.1010611
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we propose two novel low-complexity, low-delay erasure insertion schemes, namely, the output threshold test (OTT) and joint maximum output and ratio threshold Test (MO-RTT). The employment of the OTT and MO-RTT is beneficial in the context of the "errors-and-erasures" Reed-Solomon (RS) decoding in a slow frequency-hopping spread-spectrum (SFH/SS) system using M-ary frequency-shift keying (MFSK). The statistics of the erasure insertion related decision variables associated with the OTT, MO-RTT as well as with the ratio threshold test (RTT) are investigated, when the channel of each frequency-hopping (FH) slot is modeled as flat Nakagami-m fading. The transmitted signals also experience both additive white Gaussian noise (AWGN) as well as partial-band Gaussian interference (PBGI). The properties of these erasure insertion schemes are investigated with the aid of their statistics. The performance of the proposed erasure insertion schemes and that of the erasure insertion scheme using the RTT is investigated and compared in the context of RS coded SFH/SS systems using MFSK. Furthermore, the performance of the RS coded SFH/SS systems is also compared both with and without side-information concerning the PBGI.
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页码:914 / 925
页数:12
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