In-Beam Programming of Radiation-Hardened Flash-Based FPGA-RTG4

被引：0
|
作者：
Wang, Jih-Jong [1 ]
Rezzak, Nadia [1 ]
Varela, Stephen [1 ]
Nguyen, Victor [1 ]
Samiee, Salim [1 ]
Hawley, Frank [1 ]
Hamdy, Esmat [1 ]
机构：
[1] Microsemi SOC, San Jose, CA 95134 USA
来源：
2017 17TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2017年
关键词：
Field programmable gate arrays (FPGA); Flash; floating-gate transistor; single event effects (SEE);
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In-beam programming of the first radiation-hardened Flash-based FPGA. RTG4 is investigated. Programming by commercially available FlashPro is performed under perpendicular heavy-ion irradiation with LET ranging from 1.2 to 30.5 MeV-cm(2)/mg. Although there are interruptions during programming with artificially high flux in beam test, the acquired Weibull curve predicts very high successful rate of programming in space. The cause of interruptions is identified by TPA laser scanning to be single event upsets of row and column registers which setup the cells to be configured.
引用
收藏
页码：540 / 543
页数：4
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