WS2 nanotubes as tips in scanning probe microscopy

被引：115
|
作者：
Rothschild, A [1 ]
Cohen, SR
Tenne, R
机构：
[1] Weizmann Inst Sci, Dept Mat & Interfaces, IL-76100 Rehovot, Israel
[2] Weizmann Inst Sci, Chem Serv Unit, IL-76100 Rehovot, Israel
来源：
APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 25期
关键词：
D O I：
10.1063/1.125526
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
WS2 nanotubes a few microns long were attached to microfabricated Si tips and tested afterwards in an atomic force microscope by imaging a "replica" of high aspect ratio, i.e., deep and narrow grooves. These WS2 nanotube tips provide a considerable improvement in image quality for such structures when compared with commercial ultrasharp Si tips. The nanotube tip apex shape was extracted by blind reconstruction from an image of Ti spikes, showing a smooth cylindrical profile up to the end. (C) 1999 American Institute of Physics. [S0003-6951(99)03151-4].
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收藏
页码：4025 / 4027
页数：3
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