Nanosecond multiple pulse measurements and the different types of defects

Laser damage measurements with multiple pulses at constant fluence (S-on-1 measurements) are of high practical importance for design and validation of high power photonic instruments. Using nanosecond lasers, it has been recognized long ago that single pulse laser damage is linked to fabrication related defects. Models describing the laser damage probability as the probability of encounter between the high fluence region of the laser beam and the fabrication related defects are thus widely used to analyze the measurements. Nanosecond S-on-1 tests often reveal the "fatigue effect", i.e.a decrease of the laser damage threshold with increasing pulse number. Most authors attribute this effect to cumulative material modifications operated by the first pulses. In this paper we discuss the different situations that are observed upon nanosecond S-on-1 measurements of several different materials using different wavelengths and speak in particular about the defects involved in the laser damage mechanism. These defects may be fabrication-related or laser-induced, stable or evolutive, cumulative or of short lifetime. We will show that the type of defect that is dominating an S-on-1 experiment depends on the wavelength and the material under test and give examples from measurements of nonlinear optical crystals, fused silica and oxide mixture coatings.