Characterization of conducted emission at high frequency under different temperature

被引：0
|
作者：
Berbel, N. [1 ]
Fernandez-Garcia, R. [1 ]
Gil, I. [1 ]
机构：
[1] UPC, Dept Elect Engn, Terrassa, Spain
来源：
2013 9TH INTERNATIONAL WORKSHOP ON ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2013) | 2013年
关键词：
integrated circuit; EMC; switching noise; temperature impact; conducted emission;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, the characterization of the EMC conducted emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic conducted emissions, as well as on the electromagnetic noise of a clock generator.
引用
收藏
页码：147 / 151
页数：5
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