Molecular Electronics at Metal/Semiconductor Junctions. Si Inversion by Sub-Nanometer Molecular Films

被引:76
|
作者
Yaffe, Omer [1 ]
Scheres, Luc [2 ]
Puniredd, Sreenivasa Reddy [3 ,4 ]
Stein, Nir [1 ]
Biller, Ariel [1 ]
Lavan, Rotem Har [1 ]
Shpaisman, Hagay [1 ]
Zuilhof, Han [2 ]
Haick, Hossam [3 ,4 ]
Cahen, David [1 ]
Vilan, Ayelet [1 ]
机构
[1] Weizmann Inst Sci, Dept Mat & Interfaces, IL-76100 Rehovot, Israel
[2] Wageningen Univ, Organ Chem Lab, NL-6703 HB Wageningen, Netherlands
[3] Technion Israel Inst Technol, Dept Chem Engn, IL-32000 Haifa, Israel
[4] Technion Israel Inst Technol, Russell Berrie Nanotechnol Inst, IL-32000 Haifa, Israel
关键词
CRYSTALLINE SILICON SURFACES; TERMINATED SI(111) SURFACES; VOLTAIC ENERGY-CONVERSION; LINKED ORGANIC MONOLAYERS; MIS TUNNEL-DIODES; ALKYL MONOLAYERS; TRANSPORT; DEPOSITION; QUALITY; BARRIER;
D O I
10.1021/nl900953z
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Electronic transport across n-Si-alkyl monolayer/Hg junctions is, at reverse and low forward bias, independent of alkyl chain length from 18 down to 1 or 2 carbons! This and further recent results indicate that electron transport is minority, rather than majority carrier dominated, occurs via generation and recombination, rather than (the earlier assumed) thermionic emission, and, as such, is rather insensitive to interface properties. The (m)ethyl results show that binding organic molecules directly to semiconductors provides semiconductor/metal interface control options, not accessible otherwise.
引用
收藏
页码:2390 / 2394
页数:5
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