Fault Detection and Diagnosis in a Chemical Process using Long Short-Term Memory Recurrent Neural Network

被引:0
|
作者
Xavier, Gilberto M. [1 ,2 ]
de Seixas, Jose Manoel [1 ]
机构
[1] Petrobras Res & Dev Ctr, Rio De Janeiro, Brazil
[2] Univ Fed Rio de Janeiro, COPPE Poli, Signal Proc Lab, Rio De Janeiro, Brazil
关键词
deep networks; recurrent neural network; long short-term memory; fault detection and diagnosis; Tennessee Eastman chemical process; BENCHMARK;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Long short-term memory recurrent neural networks have been proved to be especially useful for learning sequences comprising longer-term patterns of unknown length as they are able to preserve long-term memory. The learning of higher level temporal features could be achieved by stacking recurrent hidden layers for faster learning with sparser representations. In this work, we propose a novel approach to data driven fault detection and diagnosis of a chemical process. The method employs a state-of-the-art deep-learning technique, viz. the long short-term memory recurrent neural network. An application of the proposed approach is performed with realistic simulated data from a chemical process literature benchmark. Results point out an excellent performance when compared to already published linear and nonlinear fault detection and diagnosis methods.
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页数:8
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