Field dependence of magnetization for a thin ferromagnetic film on rough antiferromagnetic surface

被引：6
|
作者：
Kovalev, A. [1 ,2 ]
Pankratova, M. [1 ]
机构：
[1] Natl Acad Sci Ukraine, B Verkin Inst Low Temp Phys & Engn, UA-61103 Kharkov, Ukraine
[2] Kharkov Natl Univ, UA-61107 Kharkov, Ukraine
来源：
SUPERLATTICES AND MICROSTRUCTURES | 2014年 / 73卷
关键词：
Ferromagnetic; Antiferromagnetic; Rough interface; Exchange bias; Magnetization; EXCHANGE-ANISOTROPY; HYSTERESIS; INTERFACE; MODEL; BIAS;
D O I：
10.1016/j.spmi.2014.05.034
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Simple theoretical models are proposed for the analytical and the numerical study of the exchange bias phenomenon in the layered systems with rough AFM/FM interface. It is shown that the qualitative type of the magnetization curves depend crucially on the variation of the roughness degree. We obtain that the magnetization curves are qualitatively of the same type in the cases of perfect and rough FM/AFM interfaces. The method which allow to identify the character of the interface (rough or perfect) is proposed. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码：275 / 280
页数：6
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