Software Reliability: Development of Software Defect Prediction Models Using Advanced Techniques

被引:2
|
作者
Jagtap, Mayur [1 ]
Katragadda, Praveen [1 ]
Satelkar, Pooja [1 ]
机构
[1] John Deere Technol Ctr India, Tower 15, Pune 411013, Maharashtra, India
关键词
Defect prediction; Fuzzy logic; Growth model; Neural network; Software reliability; Software metrics;
D O I
10.1109/RAMS51457.2022.9893986
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Development of next generation of smarter machines and services requires building an easy-to-use technology stack. These technologies include hardware, embedded software, data, and applications. Smarter machines support carrying out the precise job, better decision making, and create new ways of doing things to reduce cost and increase speed, accuracy, and automation. As technology meets iron through smart machines, there is increased embedded software within products. To provide distinctive customer experience for a solution system, along with reliability of hardware, development of reliable software also plays a critical role. This paper proposes models in which software reliability is a function of the number of residual faults and is measured with the help of software metrics based on development data. The intent is to establish a statistical relationship between product metrics (that deal with the measurement of the software product) or process metrics (the process by which it is developed) with measures of quality. Using both a pattern recognition algorithm approach for classifying fault proneness and applying fuzzy logic to software metrics for defect prediction is found to be beneficial for improving software reliability prediction in early development phases. This paper proposes non-parametric models like Artificial Neural Network from deep learning to predict expected number of failures utilizing past failure data for software reliability estimation and release readiness during launch.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Advanced Models for Software Reliability Prediction
    Bluvband, Zigmund
    Porotsky, Sergey
    Talmor, Michael
    [J]. ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2011 PROCEEDINGS, 2011,
  • [2] Integrative Software Design for Reliability: Beyond Models and Defect Prediction
    Asthana, Abhaya
    Okumoto, Kazu
    [J]. BELL LABS TECHNICAL JOURNAL, 2012, 17 (03) : 37 - 59
  • [3] Software reliability prediction using machine learning techniques
    Jaiswal A.
    Malhotra R.
    [J]. International Journal of System Assurance Engineering and Management, 2018, 9 (1) : 230 - 244
  • [4] Software defect prediction using global and local models
    Suhag, Vikas
    Dubey, Sanjay Kumar
    Sharma, Bhupendra Kumar
    [J]. INTERNATIONAL JOURNAL OF SYSTEM ASSURANCE ENGINEERING AND MANAGEMENT, 2024, 15 (08) : 4003 - 4017
  • [5] Connecting Software Reliability Growth Models to Software Defect Tracking
    Nafreen, Maskura
    Luperon, Melanie
    Fiondella, Lance
    Nagaraju, Vidhyashree
    Shi, Ying
    Wandji, Thierry
    [J]. 2020 IEEE 31ST INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING (ISSRE 2020), 2020, : 138 - 147
  • [6] PREDICTION OF SOFTWARE-RELIABILITY USING CONNECTIONIST MODELS
    KARUNANITHI, N
    WHITLEY, D
    MALAIYA, YK
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1992, 18 (07) : 563 - 574
  • [7] A critique of software defect prediction models
    Fenton, NE
    Neil, M
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1999, 25 (05) : 675 - 689
  • [8] Software Defect Prediction Analysis Using Machine Learning Techniques
    Khalid, Aimen
    Badshah, Gran
    Ayub, Nasir
    Shiraz, Muhammad
    Ghouse, Mohamed
    [J]. SUSTAINABILITY, 2023, 15 (06)
  • [9] Software Defect Prediction Using Software Metrics - A survey
    Punitha, K.
    Chitra, S.
    [J]. 2013 INTERNATIONAL CONFERENCE ON INFORMATION COMMUNICATION AND EMBEDDED SYSTEMS (ICICES), 2013, : 555 - 558
  • [10] Impact of Using Information Gain in Software Defect Prediction Models
    Rana, Zeeshan Ali
    Awais, Mian M.
    Shamail, Shafay
    [J]. INTELLIGENT COMPUTING THEORY, 2014, 8588 : 637 - 648