Dual-frequency Scattering Measurement System for Radar Cross-Section Imaging

被引：0
|
作者：
Hu Weidong [1 ]
Sun Houjun [1 ]
Fu Pengcheng [1 ]
Lv Xin [1 ]
机构：
[1] Beijing Inst Technol, Beijing 100081, Peoples R China
来源：
2008 CHINA-JAPAN JOINT MICROWAVE CONFERENCE (CJMW 2008), VOLS 1 AND 2 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
X band and Ka band front-ends are integretd into one measurement system in order to get radar cross section and images of complex objects, software defined radaio is applied in system design. Then ISAR processing technology is investigated to gain two dimension scattering centers distribution, and radar cross section imaging and CBP algorithm is verified to obtaining object information efficiently.
引用
收藏
页码：471 / 475
页数：5
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