Scanning Tunneling Spectroscopy

被引:71
|
作者
Zandvliet, Harold J. W. [1 ]
van Houselt, Arie [1 ]
机构
[1] Univ Twente, Phys Aspects Nanoelect & MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
关键词
scanning probe microscopy; surfaces; single-electron tunneling; thermodynamics; FLIP-FLOP MOTION; SI AD-DIMERS; BUCKLED DIMERS; MICROSCOPY; SURFACE; ELECTRODES; MOLECULE; CONFINEMENT; ENERGETICS; DYNAMICS;
D O I
10.1146/annurev-anchem-060908-155213
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The scanning tunneling microscope (STM) has revolutionized our ability to explore and manipulate atomic-scale solid surfaces. In addition to its unparalleled spatial power, the STM can study dynamical processes, such as molecular conformational changes, by recording current traces as a function of time. It can also be employed to measure the physical properties of molecules or nanostructures down to the atomic scale. Combining STM imaging with measurement of current-voltage (1-V) characteristics [i.e., scanning tunneling spectroscopy (STS)] at similar resolution mikes it possible to obtain a detailed map of the electronic structure of a surface. For many years, STM lacked chemical specificity; however, the recent development of STM-IETS (inelastic electron tunneling spectroscopy) has allowed LIS to measure the vibrational spectrum of a single molecule. This review introduces and illustrates these recent developments with a few simple scholarly examples.
引用
收藏
页码:37 / 55
页数:19
相关论文
共 50 条
  • [1] SCANNING TUNNELING SPECTROSCOPY
    FEENSTRA, RM
    SURFACE SCIENCE, 1994, 299 (1-3) : 965 - 979
  • [2] The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon
    V. I. Ivanov-Omskii
    A. B. Lodygin
    S. G. Yastrebov
    Semiconductors, 2000, 34 : 1355 - 1362
  • [3] Characterizing nanoparticles by scanning tunneling microscopy and scanning tunneling spectroscopy
    Schmidt-Ott, A.
    Marsen, B.
    Sattler, K.
    Journal of Aerosol Science, 1997, 28 (SUPPL. 1)
  • [4] The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon
    Ivanov-Omskii, VI
    Lodygin, AB
    Yastrebov, SG
    SEMICONDUCTORS, 2000, 34 (12) : 1355 - 1362
  • [5] SCANNING TUNNELING SPECTROSCOPY ON SI
    NEDDERMEYER, H
    TOSCH, S
    ULTRAMICROSCOPY, 1988, 25 (02) : 135 - 147
  • [6] SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY
    HUMBERT, A
    ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING, 1990, 15 (2B): : 251 - 271
  • [7] Scanning tunneling vibrational spectroscopy
    Semenor Inst. of Chemical Physics, Russian Academy of Sciences, Kosygin str. 4, Moscow 117977, Russia
    Spectrosc Lett, 7 (1429-1440):
  • [8] THEORY OF SCANNING TUNNELING SPECTROSCOPY
    CHEN, CJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 319 - 322
  • [9] Scanning tunneling spectroscopy - Preface
    Schneider, WD
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2000, 109 (1-2) : IX - IX
  • [10] THEORY OF SCANNING TUNNELING SPECTROSCOPY
    LOUIS, E
    FLORES, F
    ECHENIQUE, PM
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1989, 109 (1-4): : 309 - 323