Uranium oxidation kinetics monitored by in-situ X-ray diffraction

被引:15
|
作者
Zalkind, S. [1 ]
Rafailov, G. [1 ]
Halevy, I. [1 ]
Livneh, T. [1 ]
Rubin, A. [1 ]
Maimon, H. [1 ]
Schweke, D. [1 ]
机构
[1] Nucl Res Ctr Negev, POB 9001, IL-84190 Beer Sheva, Israel
关键词
DIOXIDE; UO2; OXYGEN; OXIDE; METAL;
D O I
10.1016/j.jnucmat.2016.12.021
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The oxidation kinetics of U-0.1 wt%Cr at oxygen pressures of 150 Torr and the temperature range of 90-150 degrees C was studied by means of in-situ X-ray diffraction (XRD). A "breakaway" in the oxidation kinetics is found at -0.25 gm, turning from a parabolic to a linear rate law. At the initial stage of oxidation the growth plane of UO2(111) is the prominent one. As the oxide thickens, the growth rate of UO2(220) plane increases and both planes grow concurrently. The activation energies obtained for the oxide growth are Q(parabolic) = 17.5 kcal/mol and Q(linear) = 19 kcal/mol. Enhanced oxidation around uranium carbide (UC) inclusions is clearly observed by scanning electron microscopy (SEM). (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:202 / 206
页数:5
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