Challenges in modeling of accelerated life testing

被引：0
|
作者：
Jones, K [1 ]
机构：
[1] Motorola Inc, Adv Simulat Grp, iDEN Mech Design Ctr, Ft Lauderdale, FL 33304 USA
来源：
ITHERM 2004, VOL 2 | 2004年
关键词：
D O I：
暂无
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
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页码：726 / 726
页数：1
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