Measurement and modelization of silica opal optical properties

被引：2

作者：

Avoine, Amaury ^{[1
,2
]}

Hong, Phan Ngoc ^{[1
,2
,3
]}

Frederich, Hugo ^{[1
,2
]}

Aregahegn, Kifle ^{[1
,2
]}

Benalloul, Paul ^{[1
,2
]}

Coolen, Laurent ^{[1
,2
]}

Schwob, Catherine ^{[1
,2
]}

Nga, Pham Thu ^{[3
]}

Gallas, Bruno ^{[1
,2
]}

Maitre, Agnes ^{[1
,2
]}

机构：

[1] Univ Paris 06, Sorbonne Univ, Inst NanoSci Paris, UMR 7588, F-75005 Paris, France

[2] Inst NanoSci Paris, CNRS, UMR 7588, F-75005 Paris, France

[3] Vietnam Acad Sci & Technol, Inst Mat Sci, Hanoi, Vietnam

来源：

ADVANCES IN NATURAL SCIENCES-NANOSCIENCE AND NANOTECHNOLOGY | 2014年 / 5卷 / 01期

关键词：

photonic crystal; optical characterization; specular reflection spectroscopy; effective index; band structure; FDTD simulations; PHOTONIC CRYSTALS; SYNTHETIC OPALS; BRAGG-DIFFRACTION; BAND; LIGHT;

D O I：

10.1088/2043-6262/5/1/015005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We present the synthesis process and optical characterization of artificial silica opals. The specular reflection spectra are analyzed and compared to band structure calculations and finite difference time domain (FDTD) simulations. The silica optical index is a key parameter to correctly describe an opal and is usually not known and treated as a free parameter. Here we propose a method to infer the silica index, as well as the silica spheres diameter, from the reflection spectra and we validate it by comparison with two independent infrared methods for the index and, scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements for the spheres diameter.

引用

页数：6

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