Laser optics cover the range 157 nm to 1064 nm

被引:0
|
作者
不详
机构
来源
OPTICS AND LASER TECHNOLOGY | 1999年 / 31卷 / 05期
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:VIII / VIII
页数:1
相关论文
共 50 条
  • [1] Laser-induced damage of transmissive optics at 1064 nm
    Hu, JP
    Zhang, WH
    Ma, P
    Xu, Q
    2ND INTERNATIONAL CONFERENCE ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: ADVANCED OPTICAL MANUFACTURING TECHNOLOGIES, 2006, 6149
  • [2] Controlled contamination of optics under 157-nm laser irradiation
    Bloomstein, TM
    Liberman, V
    Palmacci, ST
    Rothschild, M
    OPTICAL MICROLITHOGRAPHY XIV, PTS 1 AND 2, 2001, 4346 : 685 - 694
  • [3] Pulsed laser ablation of gold at 1064 nm an 532 nm
    Torrisi, L
    Picciotto, A
    Andó, L
    Gammino, S
    Margarone, D
    Láska, L
    Pfeifer, M
    Krása, J
    CZECHOSLOVAK JOURNAL OF PHYSICS, 2004, 54 : 421 - 430
  • [4] 157nm takes optics to 2010
    Resor, G
    SOLID STATE TECHNOLOGY, 2003, 46 (06) : 34 - +
  • [5] Attenuation characterization of 532 nm and 1064 nm laser propagating in rain
    Guo, Jing
    Zhao, Xue-Jian
    OPTIK, 2016, 127 (20): : 9088 - 9094
  • [6] Laser Durability Evaluations of Silica glass at 1064 nm and 213 nm
    Kashiwagi, R.
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS 2018, 2018, 10805
  • [7] Laser damage resistance of dichroic mirrors at 532 nm and 1064 nm
    Cheng, Xinbin
    Shen, Zhengxiang
    Jiao, Hongfei
    Zhang, Jinlong
    Ma, Bin
    Ding, Tao
    Wang, Zhanshan
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2010, 2010, 7842
  • [8] 1064 nm Nd:YAG laser intracavity pumped at 946 nm
    Lue, Y. F.
    Xia, J.
    Zhang, X. H.
    LASER PHYSICS, 2010, 20 (04) : 766 - 768
  • [9] Characteristics of deep UV optics at 193nm & 157nm
    Callahan, GP
    Flint, BK
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1998, 1999, 3578 : 45 - 53
  • [10] Pulsed fiber laser generating at 1064 nm
    Swiderski, J
    Konieczny, P
    Zajac, A
    Skorczakowski, M
    Nyga, P
    PHOTONICS APPLICATIONS IN ASTRONOMY, COMMUNICATIONS, INDUSTRY, AND HIGH-ENERGY PHYSICS EXPERIMENTS II, 2004, 5484 : 396 - 399