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Solution of the heat equation in problems concerning the functional disability of semiconductor elements in the input circuits of receiving devices
被引：0
|作者：
Dobykin, VD
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中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
On the basis of the analytical solution to the uniform linear heat equation, the parameters of a high-power microwave radiation ensuring the heat injury of semiconductor elements in the input circuits of different receiving devices are estimated. Basic parameters of the p-n junctions in the elements are taken into account. The results of the solution are analyzed as applied to the contact mixer silicon microwave diode.
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页码：339 / 342
页数：4
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