High precision half-life measurement of 147Sm α decay from thin-film sources

被引：14
|
作者：
Wilsenach, H. [1 ]
Zuber, K. [1 ]
Degering, D. [2 ]
Heller, R. [3 ]
Neu, V. [4 ,5 ]
机构：
[1] Tech Univ Dresden, Inst Kern & Teilchenphys, D-01069 Dresden, Germany
[2] VKTA Radiat Protect Analyt & Disposal Rossendorf, POB 510119, D-01314 Dresden, Germany
[3] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Bautzner Landstr 400, D-01328 Dresden, Germany
[4] Inst Metall Mat, Helmholtzstr 20, D-01069 Dresden, Germany
[5] IFW Dresden, Helmholtzstr 20, D-01069 Dresden, Germany
来源：
PHYSICAL REVIEW C | 2017年 / 95卷 / 03期
关键词：
NUCLEAR-DATA SHEETS; RADIOACTIVITY;
D O I：
10.1103/PhysRevC.95.034618
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
An investigation of the alpha decay of Sm-147 was performed using an ultra-low-background twin Frisch-grid ionization chamber (TF-GIC). Four natural samarium samples were produced using pulsed laser deposition in ultrahigh vacuum. The abundance of the Sm-147 isotope was measured using inductively coupled plasma mass spectrometry. A combined half-life value for Sm-147 of 1.079(26) x 10(11) yr was measured. A search for the alpha decay into the first excited state of Nd-143 has been performed using gamma spectroscopy, resulting in a lower half-life limit of T-1/2 > 3.1 x 10(18) yr (at 90% C. L.).
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页数：9
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