Capacitive meter of local thickness of liquid films

被引:0
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作者
Krotov, SV
Nazarov, AD
Pavlenko, AN
Pecherkin, NI
Serov, AF
Chekhovich, VY
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An automated broadband capacitive meter of the thickness of cryogenic liquid films on open surfaces and in narrow channels is described. The design of the capacitive probe and the equipment, which provide local measurements of the wave liquid flow profile with high spatial (similar to 1 mm) and time (similar to 1 ms) resolution, are selected in consideration of specific features of the film flow: the thickness of draining nitrogen film (0.05-1 mm), the amplitude and length of surface waves (greater than or equal to 0.5 mm), the film drain-off speed (similar to 0.3 m/s), and the characteristic time of the process (similar to 5 ms).
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页码:136 / 139
页数:4
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