Tensile testing of insulating thin films;: humidity effect on tensile strength of SiO2 films

被引:59
|
作者
Tsuchiya, T [1 ]
Inoue, A [1 ]
Sakata, J [1 ]
机构
[1] Toyota Cent Res & Dev Labs Inc, Adv Device Lab, Nagakute, Aichi 4801192, Japan
关键词
thin film mechanical property; tensile test; fracture toughness; SiO2; humidity;
D O I
10.1016/S0924-4247(99)00363-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Humidity effect on the strength of a plasma-enhanced chemical vapor deposition (CVD) SiO2 film is evaluated with new tensile testing method using an electrostatic force grip. This method can test insulating films without troublesome specimen preparation and careful handling. To measure the humidity effect, two thin film tensile testers are used. One can perform test in air, and the other in a vacuum. With these apparatus, the tensile strength and the fracture toughness of the SiO2 films are measured both in a vacuum and in air. The mean strength is 1.2-1.9 GPa in a vacuum and 0.6-1.0 GPa in air, and the mean toughness is 1.3-2.0 MPa root m in a vacuum and 0.6-0.9 MPa root m in air. These values are strongly affected by the testing environment, and these effects must be mainly due to water in air. (C) 2000 Elsevier Science S.A. All rights reserved.
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页码:286 / 290
页数:5
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