A semi-empirical approach for heavy ion SEU cross section calculations

被引:13
|
作者
Wrobel, Frederic [1 ]
Hubert, Guillaume
Iacconi, Philibert
机构
[1] Univ Nice Sophia Antipolis, CRESA, LPES, F-06108 Nice 2, France
[2] EADS CCR, F-92152 Suresnes, France
关键词
diffusion model; heavy ion; Rutherford scattering; single event upset; Weibull;
D O I
10.1109/TNS.2006.886200
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The main goal of this paper is to propose an approach to calculate heavy ion SEU cross sections. The starting point is the diffusion model theory, which allows the charges diffusion but does not account for electrical field in the device. This electrical field is not necessary known in the device and is difficult to be introduced simply in the calculations. For this reason, we have empirically modified the diffusion model to account for electrical field. With only one empirical parameter, our Monte Carlo simulations allow reproducing the Weibull curves obtained for several technologies. In the last section, we focus on sub-threshold events and emphasize that they are partly due to the Rutherford scattering.
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页码:3271 / 3276
页数:6
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