X-ray fluorescence analysis of trace elements in light matrices - Applications and outlook

被引：1
|
作者：
Bonvin, D [1 ]
Yellepeddi, R
Matula, G
机构：
[1] ThermoARL, Appl Res Labs SA, CH-1024 Ecublens, Switzerland
[2] Thermo Optek France, F-78180 Montigny Le Bretonneux, France
来源：
JOURNAL DE PHYSIQUE IV | 2002年 / 12卷 / PR6期
关键词：
D O I：
10.1051/jp4:20020215
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Continuous improvements of the sensitivity of wavelength dispersive X-ray fluorescence spectrometers (WDXRF), allow today and depending on the analytical requirements, new analytical strategies: reduction of the analysis time or reduction of the tube power in order to become independent of external constraints (notably cooling water). Some examples are shown in the case of heavy elements analysis in light matrices.
引用
收藏
页码：77 / 82
页数：6
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