共 50 条
- [9] An efficient seeds selection method for LFSR-based test-per-clock BIST PROCEEDING OF THE 2002 3RD INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2002, : 261 - 266
- [10] An Approach to LFSR-Based X-Masking for Built-In Self-Test 2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017), 2017,