Growth, structural and optical properties of CdxZn1-xS thin films deposited using spray pyrolysis technique

被引：37

作者：

Raviprakash, Y. ^{[1
]}

Bangera, Kasturi V. ^{[1
]}

Shivakumar, G. K. ^{[1
]}

机构：

[1] Natl Inst Technol, Thin Film Lab, Dept Phys, Surathkal 575025, Karnataka, India

来源：

CURRENT APPLIED PHYSICS | 2010年 / 10卷 / 01期

关键词：

Semiconductor thin films; Spray pyrolysis; XRD; SEM; EDAX; UV-Vis spectrophotometer; PHYSICAL-PROPERTIES; ZNXCD1-XS FILMS; ZNS;

D O I：

10.1016/j.cap.2009.05.020

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

CdxZn(1-x)S (x = 0, 0.2, 0.4, 0.6, 0.8, and 1) thin films were deposited by the chemical spray pyrolysis technique using a less used combination of chemicals. Depositions were done at 573 K on cleaned glass substrates. The composition, surface morphology and structural properties of deposited films were studied using EDAX, SEM and X-ray diffraction technique. XRD studies reveal that all the films are crystalline with hexagonal (wurtzite) structure and inclusion of Cd into the structure of ZnS improved the crystallinity of the films. The value of lattice constant 'a' and 'c' have been observed to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm, respectively. The band gap of the thin films varied from 3.32 to 2.41 eV as composition varied from x = 0.0-1.0. It was observed that presence of small amount of cadmium results in marked changes in the optical band gap of ZnS. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：193 / 198

页数：6

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