Extended model-based testing toward high code coverage rate

被引:0
|
作者
Takahashi, J
Kakuda, Y
机构
[1] SAP Labs, Koto Ku, Tokyo 1350064, Japan
[2] Hiroshima City Univ, Fac Informat Sci, Hiroshima 7313194, Japan
来源
SOFTWARE QUALITY - ECSQ 2002 | 2002年 / 2349卷
关键词
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Recently, it has become popular to use applications on window operating systems, such as Microsoft Windows and GNOME, and for this we attempt to use the GUI specific testing approach. Legacy type of approaches, such as control flow path and data flow path testing, are not always effective testing methods for GUI application. Thus, model-based testing was newly established and often used in GUI application testing. But the model-based testing method is not yet mature and has not been researched enough. Our developed model-based testing focuses not only on application behavior but also on data and external factors. In addition, we realized that model-based testing lacks the ability to find some types of defect. In this paper, we will clarify which factors are lacking and offer solutions with case studies.
引用
收藏
页码:310 / 320
页数:11
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