Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites

被引:1
|
作者
Shibayama, T [1 ]
He, GW
Takahashi, H
Kohyama, A
机构
[1] Hokkaido Univ, Ctr Adv Res Energy Technol, Sapporo, Hokkaido 0608628, Japan
[2] Kyoto Univ, Inst Adv Energy, Uji, Kyoto 6110011, Japan
来源
JOURNAL DE PHYSIQUE IV | 2000年 / 10卷 / P6期
关键词
D O I
10.1051/jp4:2000617
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The continuous fiber ceramic composite (CFCC), such as SiC/SiC composites have attractive features for advanced energy conversion and production systems, especially gas turbines and fusion power reactors. Because SiC is well known to exhibit a quite fast decay behavior and an excellent oxidation resistance behavior due to the formation of a passive SiO2 layer. The variety of criteria for environmental effects of microstructural evolution at interface of SiC/SiC composites is proposed. Of interest is that the degradation of the composite is observed after annealed at 1500 degrees C under ultra high purity Ar flow condition. However there are few data of nano-structure analyses at interface of SiC/SiC composites. In this work, the environmental effects of microstructural evolution in SiC/SiC composites are examined by a Field Emission type High-Resolution Electron Microscopy (FE-HRTEM) and a Parallel Electron Energy Loss Spectroscopy (PEELS). A possible mechanism for this degradation is discussed and proposed.
引用
收藏
页码:97 / 103
页数:7
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