Modeling extreme ultraviolet ablation interactions

被引:0
|
作者
Lolley, J. A. [1 ]
Wilson, S. A. [1 ]
Tallents, G. J. [1 ]
机构
[1] Univ York, Dept Phys, York Plasma Inst, York, N Yorkshire, England
关键词
ablation; short-wavelength; EUV; theory;
D O I
10.1117/12.2523137
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Compact extreme ultraviolet (EUV) laser sources can be used for laboratory-scale ablation experiments at intensities of 1 x 10(11) W cm(-2) and higher. The depths of ablation achieved using focused laser output at 46.9nm to irradiate solid targets of aluminium, gold, and copper have been modeled. Two simple models are considered; an adaptation of an ultra-short pulse model, and an ablation velocity model. We show that the attenuation length of the material plays an important role in the physics of the ablation. A more detailed one-dimensional model including absorption by inverse bremsstrahlung absorption and photo-ionization, corrected to include electron degeneracy effects, is used to evaluate the opacity of the ablation plasma and subsequent ablation depths.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] The role of photo-ionization in extreme ultraviolet ablation interactions
    Lolley, J. A.
    Tallents, G. J.
    INTERNATIONAL CONFERENCE ON X-RAY LASERS 2020, 2021, 11886
  • [2] Nanoscale resolution microscopy and ablation with extreme ultraviolet lasers
    Menoni, C. S.
    Brizuela, F.
    Brewer, C.
    Bravo, H.
    Langdon, B.
    Martz, D.
    Vaschenko, G.
    Luther, B.
    Marconi, M. C.
    Rocca, J. J.
    Chao, W.
    Anderson, E. H.
    Attwood, D. T.
    Vinogradov, A. V.
    Artioukov, I. A.
    Pershyn, Y. P.
    Kondratenko, V. V.
    2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2007, : 488 - +
  • [3] Influence of defects on extreme ultraviolet laser ablation of LiF
    Cherednikov, Yaroslav
    Inogamov, Nail A.
    Urbassek, Herbert M.
    PHYSICAL REVIEW B, 2013, 88 (13)
  • [4] Modeling extreme ultraviolet suppression of electrostatic analyzers
    Gershman, Daniel J.
    Zurbuchen, Thomas H.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (04):
  • [5] Nano-scale ablation with a compact extreme ultraviolet laser
    Menoni, C. S.
    Vaschenko, G.
    Bravo, H.
    Brizuela, F.
    Rocca, J. J.
    Chao, W.
    Anderson, E. H.
    Attwood, D. T.
    Hemberg, O.
    Frazer, B.
    Bloom, S.
    2006 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2006, : 953 - +
  • [6] Ablation of Submicrometer Holes Using an Extreme-Ultraviolet Laser
    Rossall, Andrew K.
    Aslanyan, Valentin
    Tallents, Greg J.
    Kuznetsov, Ilya
    Rocca, Jorge J.
    Menoni, Carmen S.
    PHYSICAL REVIEW APPLIED, 2015, 3 (06):
  • [7] Nanometer-scale imaging and ablation with Extreme Ultraviolet lasers
    Menoni, C. S.
    Brizuela, F.
    Brewer, C.
    Bravo, H.
    Langdon, B.
    Berrill, M.
    Martz, D.
    Vaschenko, G.
    Marconi, M. C.
    Rocca, J. J.
    Chao, W.
    Anderson, E. H.
    Attwood, D. T.
    Vinogradov, A. V.
    Artioukov, I. A.
    Pershyn, Y. P.
    Kondratenko, V. V.
    Hemberg, O.
    Frazer, B.
    Bloom, S.
    2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5, 2007, : 1401 - +
  • [8] MODELING THE SUBPICOSECOND PULSE-COMPRESSION IN THE VACUUM ULTRAVIOLET AND THE EXTREME ULTRAVIOLET
    BLAGOEVA, AB
    DINEV, SG
    DREISCHUH, AA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1992, 9 (06) : 909 - 914
  • [9] Nanoscale isotopic imaging by extreme ultraviolet laser ablation mass spectrometry
    Rush, Lydia A.
    Green, Tyler
    Kuznetsov, Ilya
    Reilly, Dallas
    Rocca, Jorge J.
    Duffin, Andrew M.
    Menoni, Carmen S.
    2019 IEEE PHOTONICS CONFERENCE (IPC), 2019,
  • [10] Ablation of solids using a femtosecond extreme ultraviolet free electron laser
    Stojanovic, N.
    von der Linde, D.
    Sokolowski-Tinten, K.
    Zastrau, U.
    Perner, F.
    Foerster, E.
    Sobierajski, R.
    Nietubyc, R.
    Jurek, M.
    Klinger, D.
    Pelka, J.
    Krzywinski, J.
    Juha, L.
    Cihelka, J.
    Velyhan, A.
    Koptyaev, S.
    Hajkova, V.
    Chalupsky, J.
    Kuba, J.
    Tschentscher, T.
    Toleikis, S.
    Duesterer, S.
    Redlin, H.
    APPLIED PHYSICS LETTERS, 2006, 89 (24)