Size-dependent piezoelectricity in zinc oxide nanofilms from first-principles calculations

被引:42
|
作者
Li, Chun
Guo, Wanlin [1 ]
Kong, Yong
Gao, Huajian
机构
[1] Nanjing Univ Aeronaut & Astronaut, Inst Nano Sci, Nanjing 210016, Peoples R China
[2] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
关键词
D O I
10.1063/1.2430686
中图分类号
O59 [应用物理学];
学科分类号
摘要
The size dependence of the piezoelectricity in ZnO nanofilms is investigated using ab initio density-functional theory calculations. The effective piezoelectric constant of ZnO nanofilms increases monotonically with increasing film thickness in the nanoscale simulated in the present work, and surprisingly, exceeds that of the bulk ZnO when the thickness is greater than 2.4 nm. The enhancement over the bulk value reaches 11% when the film thickness is 2.9 nm. (c) 2007 American Institute of Physics.
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页数:3
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