Orientation control of (Bi,La)4Ti3O12 thin films by addition of silicates and germanates

被引:0
|
作者
Kawashima, Y
Kijima, T
Ishiwara, H
机构
[1] Tokyo Inst Technol, Frontier Collaborat Res Ctr, Midori Ku, Yokohama, Kanagawa 2268503, Japan
[2] R&D Assoc Future Electron Devices, Taito Ku, Tokyo 1100014, Japan
关键词
D O I
10.1080/10584580215341
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Orientation of crystallites in (Bi,La)(4)Ti3O12 (BLT) thin films were successfully controlled by adding such silicates and germanates as Bi2SiO5 , ZrSiO4 and La2GeO5 . The ferroelectric films were formed by spin-coating mixed sol-gel solutions of BLT and silicate or germanate on a Pt/Ti/SiO2/Si structure. It was found from XRD analysis that the preferred orientation of crystallites in the BLT films was changed by the additives. That is, the orientation of crystallites in a Bi2SiO5-added BLT film was random, while it was almost perfectly c-axis-oriented in La2GeO5-added BLT and it was strongly (117)-oriented when ZrSiO4 was added to BLT. It was also found that the remnant polarization and coercive field changed reflecting these different orientations.
引用
收藏
页码:197 / 201
页数:5
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