Use the X-ray Diffraction in Forensic Science as a Device for Phase Analysis

被引：0
|
作者：
Kotrly, Marek [1 ]
机构：
[1] Inst Criminalist Prague, Prague, Czech Republic
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2005年 / 61卷
关键词：
forensic microanalysis; powder diffraction; phase analysis;
D O I：
10.1107/S0108767305079560
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P.29.01.1
引用
收藏
页码：C495 / C495
页数：1
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