Effects of oxygen atmosphere on surface properties of Sc-O/W(100) system as Schottky emitter at high temperature

被引：5
|
作者：
Nakanishi, Y. [1 ]
Nagatomi, T. [1 ]
Takai, Y. [1 ]
机构：
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan
来源：
SURFACE AND INTERFACE ANALYSIS | 2006年 / 38卷 / 12-13期
关键词：
Auger electron spectroscopy (AES); low-energy electron diffraction (LEED); work function measurement; Sc-O/W(100) emitter; oxygen exposure;
D O I：
10.1002/sia.2415
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The dependence of properties of the Sc-O/W(100) system on the partial pressure of oxygen was investigated by means of Auger electron spectroscopy, low-energy electron diffraction and work function measurement. The (1 x 1)-Sc-O/W(100) surface having a low work function, which was prepared by heating at 1700 K under ultrahigh vacuum (UHV) conditions, hardly showed any changes in surface properties at 1500 K, the operating temperature of the Sc-O/W(100) emitter, in a UHV of similar to 5 x 10(-10) Torr. In contrast, the (1 x 1) Sc-O/W(100) surface was changed to the (2 x 1)-(1 x 2) Sc-O/W(100) surface having a high work function by heating at 1500 K in an oxygen atmosphere of even 5 x 10(-0) Torr. The present results revealed that the partial pressure of oxygen around the Sc-O/W(100) tip is one of the most important factors for determining the optimum preparation and operating conditions of the Sc-O/W(100) emitter. Copyright (C) 2006 John Wiley & Sons, Ltd.
引用
收藏
页码：1594 / 1597
页数：4
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