One-Port Calibration Methods Applicable to Free-Space Material Measurement

被引：0
|
作者：
Kang, Jin-Seob [1 ]
机构：
[1] KRISS, Safety Measurement Inst, Daejeon 34113, South Korea
来源：
2022 INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION (ISAP) | 2022年
关键词：
one-port calibration; free-space measurement; scattering parameter; material measurement;
D O I：
10.1109/ISAP53582.2022.9998744
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Accurate and precise measurement of the scattering parameters of a material under test (MUT) is essential for enhancing the measurement uncertainty of material parameter measurement of the MUT. Two one-port calibration methods applicable to a free-space one-port material measurement are described, and their measurement results are compared with those obtained from the two-port TRL method for a glass plate in W-band.
引用
收藏
页码：293 / 294
页数：2
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