Study of crystallization of different titania thin films by in-situ XRD measurements

被引：0
|
作者：
Kuzel, Radomir [1 ]
Matej, Zdenek [1 ]
Nichtova, Lea [1 ]
Hubicka, Zdenek [2 ]
Bursik, Josef [3 ]
机构：
[1] Charles Univ Prague, Dept Condensed Matter Phys, Fac Math & Phys, Prague, Czech Republic
[2] Acad Sci Czech Republ, Inst Phys, Prague, Czech Republic
[3] Acad Sci Czech Republ, Inst Inorgan Chem, Rez Near Prague, Czech Republic
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
关键词：
thin films; titanium dioxide; crystallization;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS05.P12
引用
收藏
页码：C242 / C242
页数：1
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