Time Multiplexed Triple Modular Redundancy for Single Event Upset Mitigation

被引：28
|
作者：
She, Xiaoxuan [1 ]
McElvain, K. S. [2 ]
机构：
[1] Fudan Univ, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China
[2] Syn Inc, Fullerton, CA 92832 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 04期
关键词：
Single event upset (SEU); time-multiplexed; triple modular redundancy (TMR);
D O I：
10.1109/TNS.2009.2021656
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a time-multiplexed triple modular redundancy (TMR) scheme which detects and corrects single event upsets (SEUs) through time-multiplexed resource sharing. The time-multiplexed TMR method provides self-protection against SEUs in both computation logic and voting logic. Experimental results demonstrate that the proposed scheme can reduce area and power significantly in the TMR designs of single-channel circuits and multi-channel circuits.
引用
收藏
页码：2443 / 2448
页数：6
相关论文
共 50 条
  • [1] Partial evaluation based triple modular redundancy for single event upset mitigation
    Katkoori, Srinivas
    Islam, Sheikh Ariful
    Kakarla, Sujana
    [J]. INTEGRATION-THE VLSI JOURNAL, 2021, 77 : 167 - 179
  • [2] RETRACTED: Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation (Retracted Article)
    She, Xiaoxuan
    Samudrala, P. K.
    [J]. PROCEEDINGS OF THE 2009 NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS, 2009, : 344 - +
  • [3] Low Power and High Reliable Triple Modular Redundancy Latch for Single and Multi-node Upset Mitigation
    Kumar, S. Satheesh
    Kumaravel, S.
    [J]. INTERNATIONAL JOURNAL OF ADVANCED COMPUTER SCIENCE AND APPLICATIONS, 2019, 10 (07) : 433 - 443
  • [4] Selective triple modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs
    Samudrala, PK
    Ramos, J
    Katkoori, S
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (05) : 2957 - 2969
  • [5] Single-Event Transient Tolerant Optical Receiver Using Triple Modular Redundancy
    Sattar, Sami
    Cowan, Glenn
    [J]. 2022 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 22), 2022, : 995 - 999
  • [6] Double cell upsets mitigation through triple modular redundancy
    Li, Yuanqing
    Breitenreiter, Anselm
    Andjelkovic, Marko
    Chen, Junchao
    Babic, Milan
    Krstic, Milos
    [J]. MICROELECTRONICS JOURNAL, 2020, 96
  • [7] Scheme to minimise short effects of single-event upsets in triple-modular redundancy
    She, X.
    Trimberger, S.
    [J]. IET COMPUTERS AND DIGITAL TECHNIQUES, 2010, 4 (01): : 50 - 55
  • [8] Single Event Upset Mitigation in Low Power SRAM Design
    Atias, Lior
    Teman, Adam
    Fish, Alexander
    [J]. 2014 IEEE 28TH CONVENTION OF ELECTRICAL & ELECTRONICS ENGINEERS IN ISRAEL (IEEEI), 2014,
  • [9] Self-Voting Dual-Modular-Redundancy Circuits for Single-Event-Transient Mitigation
    Teifel, John
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (06) : 3435 - 3439
  • [10] Single event upset mitigation by means of a sequential circuit state freeze
    Smith, Farouk
    [J]. MICROELECTRONICS RELIABILITY, 2012, 52 (06) : 1233 - 1240
12345