Plasma-assisted molecular beam epitaxy for ZnO based II-VI semiconductor oxides and their heterostructures

被引:30
|
作者
Chen, YF [1 ]
Ko, HJ
Hong, SK
Sekiuchi, T
Yao, T
Segawa, Y
机构
[1] Tohoku Univ, Mat Res Inst, Sendai, Miyagi 9808577, Japan
[2] Inst Phys & Chem Res, Photodynam Res Cttr, Sendai, Miyagi 980, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 03期
关键词
D O I
10.1116/1.591416
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Plasma-assisted molecular beam epitaxy of ZnO epilayers and MgZnO/ZnO heterostructures on Al2O3(0001) substrates is described. A thin MgO layer is employed as a buffer for ZnO. The influence of the buffer on the initial growth of ZnO is discussed with the corresponding reflection high-energy electron diffraction (RHEED) studies. We found that the MgO buffer promotes the lateral growth of ZnO, which results in two-dimensional growth. A 3 X 3 reconstruction is observed and the RHEED intensity oscillations are recorded. The RHEED oscillations have been used in situ to monitor and control the growth of MgZnO/ZnO heterostructures. MgZnO/ZnO single-quantum-well structures have been grown and studied by cathodoluminescence. (C) 2000 American Vacuum Society. [S0734-211X(00)09303-3].
引用
收藏
页码:1514 / 1517
页数:4
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