Evaluation of The Electric-Field Transfer Functions Between IEMI Sources and Banking IT Equipment

被引：0
|
作者：
Runke, Simon [1 ]
Clemens, Markus [1 ]
Stojilovic, Mirjana [2 ]
Sliman, Sana [2 ]
Rubinstein, Marcos [2 ]
Mora, Nicolas [3 ]
Rachidi, Farhad [3 ]
机构：
[1] Berg Univ Wuppertal, Chair Electromagnet Theory, Wuppertal, Germany
[2] Univ Appl Sci Western Switzerland, IICT, Yverdon, Switzerland
[3] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, EMC Lab, CH-1015 Lausanne, Switzerland
来源：
2015 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2015年
关键词：
bank; CST; IEMI; plane wave; transfer function; field probe;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We identify typical banking information technology (IT) equipment that is exposed and susceptible to IEMI threats. Using 3D models of the most plausible attack scenarios, we estimate the electric field transfer functions between an electric field source and the equipment under attack, using an incident plane wave, and we illustrate the application of the obtained transfer function for the calculation of the electric field at different critical locations on the considered equipment.
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页码：1345 / 1350
页数：6
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