Test and repair of non-volatile commodity and embedded memories

被引：1
|
作者：
Tsuchida, S
机构：
来源：
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/TEST.2002.1041926
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Semiconductor memory market has been driven by DRAM. However non-volatile memory market is growing remarkably because of its versatile application market. In terms of testing, it is different from DRAM. The differences, requirements and solutions of Flash memory testing are described from the viewpoint of ATE. © 2002 IEEE.
引用
收藏
页码：1223 / 1223
页数：1
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