Characterization of Dielectric Solids with Single Quantum Emitters: from Measuring at the Nano-scale to Mapping at Micro-and Macro-level

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作者：
Gladush, Maxim [1 ]
Gorshelev, Alexey [1 ]
Eremchev, Ivan [1 ]
Koehler, Juergen [2 ]
Kador, Lothar [2 ]
Naumov, Andrei [1 ]
机构：
[1] Inst Spect RAS, 5 Fizicheskaya St, Moscow 108840, Russia
[2] Univ Bayreuth, Inst Phys, D-95440 Bayreuth, Germany
来源：
2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2019年
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页数：1
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