Conductivity profile determination by eddy current for shot-peened superalloy surfaces toward residual stress assessment

被引:42
|
作者
Shen, Y. [1 ]
Lee, C.
Lo, C. C. H.
Nakagawa, N.
Frishman, A. M.
机构
[1] Iowa State Univ, Ctr NDE, Ames, IA 50011 USA
[2] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA
[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
关键词
D O I
10.1063/1.2403970
中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper demonstrates a swept high frequency eddy current (SHFEC) methodology that can determine near-surface conductivity deviation profiles of shot-peened superalloy surfaces, from which residual stress state can be assessed nondestructively. Our methodology is built around a laboratory-grade SHFEC hardware and a model-based SHFEC data inversion software, both described in this article. For the demonstration, a series of shot-peened Inconel 718 block specimens is prepared and examined by the proposed SHFEC inversion technique. The conductivity depth profiles of the samples under various shot peening intensities have been obtained by the inversion. Several sensitivity and consistency test results are given to support the reliability of the inverted conductivity profiles. The extreme near-surface regions (10-20 mu m) of the shot-peened surfaces are also examined by various microstructural characterization methods such as scanning electron microscopy, energy dispersive x-ray spectroscopy, and x-ray diffraction, to examine our inversion results microscopically. (c) 2007 American Institute of Physics.
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页数:10
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