X-ray spectrometric applications of a synchrotron x-ray microbeam

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作者
Iida, A
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O433 [光谱学];
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0703 ; 070302 ;
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Synchrotron x-ray microbeams with less than a few pm spatial resolution have been applied to x-ray spectroscopic and diffraction studies, Among various x-ray spectrometric applications, the relatively new techniques of nearsurface x-ray fluorescence analysis and the micro x-ray absorption fine structure (micro-XAFS) method have been developed, For a near-surface analysis, the grazing-exit condition is used to enhance the surface sensitivity in addition to the lateral spatial resolution, With the micro-XAFS technique, chemical-state analysis over small regions and chemical-state imaging become possible, A micro x-ray spectrometric analysis with high spatial resolution was effectively utilized for materials characterization. (C) 1997 John Wiley & Sons, Ltd.
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页码:359 / 363
页数:5
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