X-ray powder diffraction data for rhornbohedral AlPt

被引：0
|
作者：
Rodriguez, Mark A. [1 ]
Adams, David P. [1 ]
机构：
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
来源：
POWDER DIFFRACTION | 2006年 / 21卷 / 04期
关键词：
X-ray diffraction (XRD); self-propagating high-temperature synthesis (SHS); AlPt;
D O I：
10.1154/1.2362854
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
X-ray powder diffraction data for a rhombohedral AlPt phase formed by self-propagating, high-temperature reactions of Al/Pt bi-layer films are reported. Multilayer Al/Pt thin film samples, reacted in air or vacuum, transformed into rhombohedral AlPt with space group R-3(148). Indexing and lattice parameter refinement of AlPt powders (generated from thin-film samples) yielded trigonal/hexagonal unit-cell lattice parameters of a = 15.623(6) angstrom and c = 5.305(2) angstrom, Z = 39, and V = 1121.5 angstrom(3). (C) 2006 International Centre for Diffraction Data.
引用
收藏
页码：318 / 319
页数：2
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