Effect of roughness on particle adhesion in aqueous solutions:: A study of Saccharomyces cerevisiae and a silica particle

被引:10
|
作者
Goetzinger, Martin
Weigl, Bernhard
Peukert, Wolfgang
Sommer, Karl
机构
[1] 3M ESPE, D-82229 Seefeld, Germany
[2] BASF AG, GCTT, D-67056 Ludwigshafen, Germany
[3] Univ Erlangen Nurnberg, Inst Particle Technol, D-91058 Erlangen, Germany
[4] Tech Univ Munich, Lehrstuhl Maschinen & Apparatekunde, D-85350 Freising Weihenstephan, Germany
关键词
Saccharomyces cerevisiae; silica; adhesion; roughness; AFM;
D O I
10.1016/j.colsurfb.2006.11.001
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
An atomic force microscope (AFM) has been used to quantify the adhesion of living cells Saccharomyces cerevisiae on three different silica surfaces with defined roughness. The effects of support roughness on the adhesion forces of a smooth silica particle were studied in addition. A living single cell was immobilized at the apex of a tipless AFM cantilever using a key-lock mechanism. Adhesion was quantified from the force-distance data measured on a smooth silica substrate and two substrates coated with hydrophilic monodisperse silica particles with 110 and 240 nm in diameter to study the effect of roughness on particle adhesion. The AFM technique gives unique insight into the primary colonization event of biofilm formation. The new knowledge helps substantially to design surface coatings relevant for biotechnology, medicine and dentistry. (C) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:44 / 50
页数:7
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