Mid-infrared near-field spectroscopy

被引：88

作者：

Amarie, Sergiu ^{[1
]}

Ganz, Thomas ^{[1
]}

Keilmann, Fritz ^{[1
]}

机构：

[1] Max Planck Inst Quantum Opt, D-85741 Garching, Germany

来源：

OPTICS EXPRESS | 2009年 / 17卷 / 24期

关键词：

RECOGNITION; CONTRAST; SURFACE;

D O I：

10.1364/OE.17.021794

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate continuous infrared spectra from 20 nm sample spots, by combining dispersive Fourier-transform infrared spectroscopy (FTIR) with scattering near-field microscopy (s-SNOM). With the "apertureless" tip of a standard AFM cantilever in one arm of a Michelson interferometer the spectra arise simultaneously in amplitude and phase. The effect of near-field phonon resonance of SiC is used to verify background-free s-SNOM operation, and to determine the absolute scattering efficiency, at 6 cm(-1) spectral resolution. We further report first evidence of free-induction decay from a scatterer composed of parts coupled by near-fields. This is possible only with broadband illumination. It offers a new, unique tool to discriminate against background scattering artifacts. (C) 2009 Optical Society of America

引用

页码：21794 / 21801

页数：8

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