Preparation of reference materials for frit chemical analysis

被引：0

作者：

Gazulla, MF ^{[1
]}

Gómez, MP ^{[1
]}

Barba, A ^{[1
]}

Orduña, M ^{[1
]}

机构：

[1] Univ Jaume 1, Ctr Documentac, Inst Tecnol Ceram, Castellon 12006, Spain

来源：

GLASS SCIENCE AND TECHNOLOGY | 2002年 / 75卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A study was undertaken on how to prepare frit reference materials in which the following elements are analysed: Si, Al, Fe, Ca, Mg, N, K, Ti, Zr, Ba, Pb, Zn, Hf, P, B and Li. The following analytical techniques were used: X-ray fluorescence spectrometry (XRF), inductively coupled plasma optical emission spectrometry (ICP-OES), atomic absorption spectrophotometry (AAS) and titrimetry. Boron and lithium were analysed by ICP-OES, sodium and lithium by AAS, and boron by titrimetry, while the remaining frit elements and sodium were analysed by XRF. The results found by the different methods were compared and each method was validated by means of reference materials. A procedure was established for preparing frit reference materials for calibrating and validating working methods on an industrial scale.

引用

页码：184 / 190

页数：7

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