Clustering and nearest neighbour distances in atom-probe tomography

被引:101
|
作者
Philippe, T. [1 ]
De Geuser, F. [3 ]
Duguay, S. [1 ]
Lefebvre, W. [1 ]
Cojocaru-Miredin, O. [1 ]
Da Costa, G. [1 ]
Blavette, D. [2 ]
机构
[1] Univ Rouen, GPM, CNRS, UMR 6634, F-76801 St Etienne De Rouvray, France
[2] Inst Univ France, Paris, France
[3] Inst Natl Polytech Grenoble, SIMaP, CNRS, UMR 5614, F-38402 St Martin Dheres, France
关键词
Atom-probe tomography; Clustering; Nearest neighbour distances; Statistics; LOCAL MAGNIFICATION; RECONSTRUCTION; ALLOYS;
D O I
10.1016/j.ultramic.2009.06.007
中图分类号
TH742 [显微镜];
学科分类号
摘要
The measurement of chemical composition of tiny clusters is a tricky problem in both atom-probe tomography experiments and atomic simulations. A new approach relying on the distribution of the first nearest neighbour (1NN) distances between solute atoms in the 3D space composed of A and B atoms was developed. This new approach, the 1NN method, is shown to be an elegant way to get the composition of tiny B-enriched clusters embedded in a random AB solid solution. The theoretical statistical distributions of first neighbour distances P(r) for both random solid solution and solute-enriched clusters finely dispersed in a depleted matrix are established. It is shown that the most probable distance of P(r) gives directly the phase composition. Applications of this model to both one-phase SiGe alloy and boron-doped silicon containing small clusters indicate that this new approach is quite reliable. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:1304 / 1309
页数:6
相关论文
共 50 条
  • [1] Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces
    Philippe, T.
    Cojocaru-Miredin, O.
    Duguay, S.
    Blavette, D.
    [J]. JOURNAL OF MICROSCOPY, 2010, 239 (01) : 72 - 77
  • [2] An Atom-Probe Tomography Primer
    Seidman, David N.
    Stiller, Krystyna
    [J]. MRS BULLETIN, 2009, 34 (10) : 717 - 724
  • [3] An Atom-Probe Tomography Primer
    David N. Seidman
    Krystyna Stiller
    [J]. MRS Bulletin, 2009, 34 : 717 - 724
  • [4] Prospects for Nanobiology with Atom-Probe Tomography
    Thomas F. Kelly
    Osamu Nishikawa
    J. A. Panitz
    Ty J. Prosa
    [J]. MRS Bulletin, 2009, 34 : 744 - 750
  • [5] Prospects for Nanobiology with Atom-Probe Tomography
    Kelly, Thomas F.
    Nishikawa, Osamu
    Panitz, J. A.
    Prosa, Ty J.
    [J]. MRS BULLETIN, 2009, 34 (10) : 744 - 749
  • [6] ATOM-PROBE TOMOGRAPHY OF METEORITIC AND SYNTHETIC NANODIAMONDS
    Heck, P. R.
    Pellin, M. J.
    Davis, A. M.
    Isheim, D.
    Seidman, D. N.
    Hiller, J.
    Mane, A.
    Elam, J.
    Savina, M. R.
    Stephan, T.
    Stadermann, F. J.
    Zhao, X.
    Daulton, T. L.
    Floss, C.
    [J]. METEORITICS & PLANETARY SCIENCE, 2011, 46 : A90 - A90
  • [7] AN ATOM-PROBE FOR 3-DIMENSIONAL TOMOGRAPHY
    BLAVETTE, D
    BOSTEL, A
    SARRAU, JM
    DECONIHOUT, B
    MENAND, A
    [J]. NATURE, 1993, 363 (6428) : 432 - 435
  • [8] Atom-probe tomography characterization of the oxidation of stainless steel
    Lozano-Perez, Sergio
    Saxey, David W.
    Yamada, Takuyo
    Terachi, Takumi
    [J]. SCRIPTA MATERIALIA, 2010, 62 (11) : 855 - 858
  • [9] Atom-Probe Tomography of Semiconductor Materials and Device Structures
    Lauhon, Lincoln J.
    Adusumilli, Praneet
    Ronsheim, Paul
    Flaitz, Philip L.
    Lawrence, Dan
    [J]. MRS BULLETIN, 2009, 34 (10) : 738 - 743
  • [10] Atom-Probe Tomography of Semiconductor Materials and Device Structures
    Lincoln J. Lauhon
    Praneet Adusumilli
    Paul Ronsheim
    Philip L. Flaitz
    Dan Lawrence
    [J]. MRS Bulletin, 2009, 34 : 738 - 743