Mapping of Local Electrical Properties in Epitaxial Graphene Using Electrostatic Force Microscopy

被引：77
|
作者：
Burnett, Tim [1 ]
Yakimova, Rositza [2 ]
Kazakova, Olga [1 ]
机构：
[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[2] Linkoping Univ, SE-58183 Linkoping, Sweden
来源：
NANO LETTERS | 2011年 / 11卷 / 06期
关键词：
Epitaxial graphene; electrostatic force microscopy; phase contrast; surface potential;
D O I：
10.1021/nl200581g
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Local electrical characterization of epitaxial graphene grown on 4H-SiC (0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.
引用
收藏
页码：2324 / 2328
页数：5
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